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Group component tests to reduce CI time (#11134)

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This commit is contained in:
J. Nick Koston
2025-10-11 08:21:45 -10:00
committed by Jesse Hills
parent 132e949927
commit 2864bf1674
1808 changed files with 8564 additions and 5758 deletions
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6
tests/components/bme680_bsec/common.yaml
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@@ -1,9 +1,5 @@
i2c:
- id: i2c_bme680
scl: ${scl_pin}
sda: ${sda_pin}
bme680_bsec:
i2c_id: i2c_bus
address: 0x77
sensor: