Group component tests to reduce CI time (#11134)
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committed by
Jesse Hills
parent
132e949927
commit
2864bf1674
@@ -1,10 +1,6 @@
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i2c:
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- id: i2c_ade7953
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scl: ${scl_pin}
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sda: ${sda_pin}
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sensor:
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- platform: ade7953_i2c
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i2c_id: i2c_bus
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irq_pin: ${irq_pin}
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voltage:
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name: ADE7953 Voltage
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