[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
This commit is contained in:
@@ -1,9 +0,0 @@
|
||||
substitutions:
|
||||
display_reset_pin: "18"
|
||||
interrupt_pin: "20"
|
||||
reset_pin: "21"
|
||||
|
||||
packages:
|
||||
i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
|
||||
|
||||
<<: !include common.yaml
|
||||
Reference in New Issue
Block a user