[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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@@ -1,10 +0,0 @@
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substitutions:
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dc_pin: GPIO7
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cs_pin: GPIO0
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disp_cs_pin: GPIO1
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interrupt_pin: GPIO3
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reset_pin: GPIO10
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packages:
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spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml
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<<: !include common.yaml
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