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Group component tests to reduce CI time (#11134)

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This commit is contained in:
J. Nick Koston
2025-10-11 08:21:45 -10:00
committed by GitHub
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
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6
tests/components/dps310/common.yaml
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@@ -1,10 +1,6 @@
i2c:
- id: i2c_dps310
scl: ${scl_pin}
sda: ${sda_pin}
sensor:
- platform: dps310
i2c_id: i2c_bus
temperature:
name: DPS310 Temperature
pressure: