Group component tests to reduce CI time (#11134)
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@@ -1,10 +1,6 @@
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i2c:
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- id: i2c_ee895
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scl: ${scl_pin}
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sda: ${sda_pin}
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sensor:
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- platform: ee895
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i2c_id: i2c_bus
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address: 0x5F
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co2:
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name: EE895 CO2
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