Group component tests to reduce CI time (#11134)
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@@ -1,8 +1,4 @@
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i2c:
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- id: i2c_i2c_device
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scl: ${scl_pin}
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sda: ${sda_pin}
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i2c_device:
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id: i2cdev
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i2c_id: i2c_bus
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address: 0x2C
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