Group component tests to reduce CI time (#11134)
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@@ -236,12 +236,6 @@ wifi:
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ssid: MySSID
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password: password1
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uart:
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- id: uart_nextion
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 115200
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binary_sensor:
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- platform: nextion
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page_id: 0
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@@ -1,8 +1,5 @@
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substitutions:
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tx_pin: GPIO17
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rx_pin: GPIO16
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packages:
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uart: !include ../../test_build_components/common/uart/esp32-ard.yaml
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base: !include common.yaml
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display:
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@@ -1,8 +1,5 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart: !include ../../test_build_components/common/uart/esp32-c3-idf.yaml
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base: !include common.yaml
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display:
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@@ -1,8 +1,5 @@
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substitutions:
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tx_pin: GPIO17
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rx_pin: GPIO16
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packages:
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uart: !include ../../test_build_components/common/uart/esp32-idf.yaml
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base: !include common.yaml
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display:
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@@ -1,8 +1,5 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart: !include ../../test_build_components/common/uart/esp8266-ard.yaml
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base: !include common.yaml
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display:
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@@ -1,6 +1,3 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart: !include ../../test_build_components/common/uart/rp2040-ard.yaml
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base: !include common.yaml
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